Low Energy Electron Detector

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• Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… …   Wikipedia

• Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… …   Wikipedia

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …   Wikipedia

• Array of Low Energy X-ray Imaging Sensors — The Array of Low Energy X ray Imaging Sensors (ALEXIS) X ray telescopes feature curved mirrors whose multilayer coatings reflect and focus low energy X rays or extreme ultraviolet light the way optical telescopes focus visible light. The… …   Wikipedia

• Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

• Electron — For other uses, see Electron (disambiguation). Electron Experiments with a Crookes tube first demonstrated the particle nature of electrons. In this illustration, the profile of the cross shaped target is projected against the tube face at right… …   Wikipedia

• Energy-dispersive X-ray spectroscopy — (EDS, EDX or EDXRF) is an analytical technique used for the elemental analysis or chemical characterization of a sample. As a type of spectroscopy, it relies on the investigation of a sample through interactions between electromagnetic radiation… …   Wikipedia

• Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… …   Wikipedia

• Electron Beam Prober — The Electron Beam Prober (E beam Prober) is a specialized adaption of a standard Scanning Electron Microscope (SEM) that is used for semiconductor failure analysis. While a standard SEM may be operated in a voltage range of 25KeV to 30KeV, the E… …   Wikipedia

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia